Abstract
Angular scattering techniques using visible wavelengths have been applied by a number of workers to the measurement of roughness which is small compared to the wavelength of the illumination. To be generally useful as a measurement technique and for adaptive control of machining operations, however, roughnesses at least as large as 3 μm R a need to be measured. Problems of extending the range of the angular scattering technique by the use of infrared illumination are discussed and results obtained using a source with a wavelength of 3.39 μm are presented.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
