Abstract
Angular scattering techniques using visible wavelengths have been applied by a number of workers to the measurement of roughness which is small compared to the wavelength of the illumination. To be generally useful as a measurement technique and for adaptive control of machining operations, however, roughnesses at least as large as 3 μm R a need to be measured. Problems of extending the range of the angular scattering technique by the use of infrared illumination are discussed and results obtained using a source with a wavelength of 3.39 μm are presented.
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