The Ewald Microscopical Theory of the Interaction of Light with a Dielectric and the Generalized Snell Law in the Far-U.V. Region

Abstract

From an algebraic modification of the Ewald microscopical theory of diffraction follows the dispersion relation valid from X-ray to visible-light regions. In the far-U.V. region we deduce from it an approximate dispersion relation and the generalized Snell law. The dependence of the refractive indices on the angle of incidence and the birefringence of a cubic crystal are demonstrated by numerical calculations based on our general formulae.