Abstract

AbstractProcedures and methods employed to develop anX-ray emission spectrometer technique for determining the quality of decorative chromium plate are presented. Individual plate quality factors and their significance are discussed: 1.Plate thickness2.Plate density3.Plate corrosion resistanceGeometric instrumentation changes to the General Electric XRD-5S spectrometer are detailed. These alterations have made it possible to take more complete advantage of the nondestructive nature of the fluorescent method, and have also yielded an increase in useful radiation intensity of 50%.The unsuccessful attempts to employ commercially plated Hull-cell-type test panels as “standards” are described, along with the satisfactory application of fabricated standards of vacuum vapor-deposited high-purity chromium, laminated to spectrographically pure nickel foils. The merits and limitations of the resultant “absolute purity — absolute density” standard curve are shown and are related to other measurement techniques and accelerated corrosion test data.

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