Abstract
The angular divergence of the energy flow of anomalously transmitted X-rays in nearly perfect silicon crystals has been determined experimentally from image widths of dislocations on X-ray topographs. Anomalous transmission of copper, iron, and chromium radiation has been used. The result is compared with calculations using the dynamical theory of diffraction. It is shown that the angular divergence is almost constant regardless of the X-ray wavelength and that it can be made to decrease only by increasing the crystal thickness.
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