THE EMPIRICAL RELEVANCE OF THE ENDOGENOUS TECHNICAL PROGRESS FUNCTION

Abstract

KyklosVolume 29, Issue 2 p. 256-271 THE EMPIRICAL RELEVANCE OF THE ENDOGENOUS TECHNICAL PROGRESS FUNCTION Edward K. Y. Chen, Edward K. Y. Chen University of Hong Kong. The author wishes to acknowledge the helpful comments of Mr. R. W. Bacon and Mr. W. A. Eltis on an earlier draft of the paper. They are of course in no way responsible for the errors.Search for more papers by this author Edward K. Y. Chen, Edward K. Y. Chen University of Hong Kong. The author wishes to acknowledge the helpful comments of Mr. R. W. Bacon and Mr. W. A. Eltis on an earlier draft of the paper. They are of course in no way responsible for the errors.Search for more papers by this author First published: January 1976 https://doi.org/10.1111/j.1467-6435.1976.tb01973.xCitations: 2 AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Citing Literature Volume29, Issue2January 1976Pages 256-271 RelatedInformation