The Electron-scavenging Process in 3-Methylhexane Glass at 77 K Studied by ESR

Abstract

Abstract The effect of various additives, i.e., nitrous oxide, sulfur hexafluoride, methyl chloride, and sulfur dioxide, on the yield of the trapped electrons produced in the γ-irradiated 3-methylhexane (3MHX) glass at 77 K have been investigated by the ESR technique. The yields of the trapped electrons were reduced by the addition of all the solutes examined; the efficiency of electron scavenging was found to be in the order of SF6>CH3Cl>N2O>SO2. The concentration dependence of the electron scavengers showed that the efficiency of the electron scavenging in the glassy state had values intermediate between those in the gas and liquid phases. The high efficiency observed in the glassy state suggests that the non-solvated electrons before being trapped move about rapidly in the glassy matrix as the form of quasi-free electrons. The ESR-power saturation of the trapped electrons was considerably reduced by the addition of N2O; a possible mechanism of the relaxation of the ESR is proposed.