The Electrical Hysteresis Loop and Polarization Value of BaZrxTi1-xO3 Multilayer Films Material at Different Annealing Temperature (x = 0.1 and 0.08) based on Sawyer Tower Circuit

Abstract

The crystallographic properties and ferroelectric state of BZT multilayer films which deposited on Si (100) substrate was studied in this work. XRD pattern peaks show that BaZr0.1T0.9O3 and BaZr0.08Ti0.92O3 are found wellcrystallized at 800 o C for 3 hours corresponding to vary annealed temperature. The BZT multilayerfilms are identified as tetragonal-perovskite structure. This is supported by the existence of a measured hysteresis loops which the instrument and the system is on own works.Fundamentally of theoretical in physics field, the SawyerTower Circuit has been concluded to ferroelectric phenomenon analysis on sample of material with experimental result as P-E hysteresis curve.The Sawyer-Tower Circuit method was used to measure the electrical polarization with triangle wave signal at fixed frequencies 50 Hz( = 0), and maximum electrical field (Emax) were injected continuously at the 40 Volt/cm. The system plotted the electrical field with respect to polarization (P-E curves), include its value. This data was used as a parameter for determining electric property of material. These results have shown the maximum value of electric field which could be used as measurement parameter. The highest maximum polarization, 34.12 µC/cm 2 , have been determined and obtained on BaZr0.1T0.9O3 at 800 o C for 3 hours annealing process and its maximum electric field is noted to be about 38.3 Volt/cm on all samples.In the normal manner,theresultcan provide an explanation of polarization and electrical behavior of ferroelectric sample for further research.