The electrical and dielectric properties of the Au/Ti/HfO2/n-GaAs structures

Abstract

In this work, temperature dependent electrical and dielectric properties of the Au/Ti/HfO2/n-GaAs structures were investigated using capacitance–voltage (C-V) and conductance–voltage (G-V) measurements in the temperature range of 60–320 K by steps of 20 K at 1 MHz. The dielectric constant (ε′), dielectric loss (ε″), dielectric loss tangent (tanδ) and ac electrical conductivities (σac) have been calculated as a function of temperature. These values of the ε′, ε″, tanδ and σac have been found to be 2.272, 5.981, 2.631 and 3.32 × 10−6 (Ω−1cm−1) at 80 K, respectively, 1.779, 2.315, 1.301 and 1.28 × 10−6 (Ω−1cm−1), respectively at 320 K. These decrease of the dielectric parameters (ε′, ε″, tanδ and σac) have been observed at high temperatures. The experimental results show that electrical and dielectric properties are strongly temperature and bias voltage dependent.