Abstract
High-resolution electron energy loss spectroscopy (HREELS) has been used to study the (100) surface of n-type InSb (Te doped, n ≈ 1 x 10 18 cm -3). Clean, ordered surfaces were prepared by cycles of low-energy argon ion bombardment and annealing. Throughout the annealing process, a series of surface reconstructions were observed as a function of annealing temperature, by low-energy electron diffraction (LEED). Specular HREELS studies, carried out at 300 K, showed that the plasmon loss energy changed dramatically with post-bombardment annealing temperature. These changes in plasmon energy are discussed in relation to the particular surface reconstruction and the degree of surface damage induced by the ion sputtering process.
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