Abstract
Elevated temperature processing parameters affect the microstructure and electrical behaviour of thick film resistors on alumina substrates. Blended resistors (DuPont QS87 series) with a nominal sheet resistivity of 56 kΩ/□ and temperature coefficient (TCR) less than ±100 p.p.m K-1 were fired in a laboratory process that simulated production ramp rates and atmosphere.
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Schedule a callMore From: Journal of Materials Science: Materials in Electronics
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