Abstract
A study has been made of the effects of osmium tetroxide on the X-ray diffraction patterns of normal and modified sciatic nerve. Intense and well-defined diffraction patterns were obtained from OsO 4-fixed fresh nerve but not from nerve which had been initially modified by temperature changes, or treatment with lipid solvents or formalin. The effect is thought to emphasize the precise arrangement of reactive groups in fresh myelin and the disorganization of such groups which accompanies modifications. OsO 4-fixed fresh nerve appears to resist further modifications, and the structure revealed by the electron microscope probably resembles very closely the normal structure. Detailed correlation of E.M. and X-ray diffraction data is not possible because of lack of knowledge of the precise chemical action of OsO 4, but some tentative suggestions are made.
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