Abstract
Bi-axially textured Ni tapes were oxidized to form NiO as alternative buffer layers for sol-gel YBCO coated conductors. We investigated growth and stability of YBCO films on nickel oxide buffer layers without using a cap layer. Microstructure of NiO, and effects of the microstructure on the properties of YBCO were also examined. To understand microstructure formation of NiO layers, parameters of surface oxidation process such as oxidation time, temperature and atmosphere were studied. Surface morphology, thickness of NiO and YBCO layers, were studied using environmental scanning electron microscopy (ESEM). We found that surface oxidation parameters strongly affect microstructure, thickness, and morphology of NiO, and the properties of YBCO. Resistance versus temperature measurements of YBCO coated conductors was done by 4-probe measurements.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.