Abstract

Electrostatic discharge (ESD) can cause permanent and temporary failures in microelectronic devices. Protection networks are used on electrostatic discharge sensitive devices in order to raise their immunity to damage from ESD. A review is given of the causes and nature of ESD, including the case of discharge from the human body. A description of failure mechanisms is presented along with a summary of protection networks and techniques.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call