Abstract
The impact of carbon doping on the single-event transient (SET) response of SiGe HBTs was evaluated using pulsed-laser charge generation via two-photon absorption. Special device structures with different amounts of carbon were fabricated by GlobalFoundries and characterized. Despite the fact that carbon is known to introduce bulk traps in the SiGe film, experimental results show no measurable difference on the SET response of SiGe HBTs fabricated with different amounts of carbon. TCAD simulations showed that the amount of carbon required to observe changes in the SET response would significantly impair the electrical performance of the device. Thus, within practical limits, carbon has no impact on the SET response of SiGe HBTs.
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