Abstract
Theoretical and experimental investigations were performed on a double layer anti-reflection (DLAR) coating of MgF 2/CeO 2. We investigated CeO 2 films as an AR layer because they have a proper refractive index of 2.46 and demonstrate the same lattice constant as the Si substrate. An optimized DLAR coating showed a reflectance value as low as 1.87% over wavelengths ranging from 0.4 to 1.1 μm. Buried contact solar cells (BCSC) were investigated using the following structure: MgF 2/CeO 2/Ag/Cu/Ni grid/n + emitter/p-type Si base/P +/Al. The BCSC efficiency under an illumination of 50 mW/cm 2 measured as high as 19.9% when employing DLAR coatings. MgF 2/CeO 2 DLAR coatings on the BCSC cell contributed to an increase of the fill factor (from 71% to 75%) and the J sc (from 19.8 mA/cm 2 to 22.6 mA/cm 2).
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