Abstract
The investigation of the process of altered layer formation under ion bombardment for different TiO 2 modifications (rutile, anatase and the thermal oxide) and complex oxides (PbTiO 3, La 2TiO 5r, CaTiSiO 5) was carried out by means of XPS (X-ray photoelectron spectroscopy). The role of the closest chemical environment in the process of ion sputtering of simple and complex oxides is revealed.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
