Abstract
In sputter-deposited Ti-rich Ti–Ni shape memory alloy thin films, there are two peculiartypes of precipitates: plate-like GP zones formed along directions of the Ti–Ni phase and sphericalTi2Ni precipitates homogenously distributed within grains. The effect of these precipitates ontwinning in stress-induced martensite were studied with the use of a transmission electronmicroscope and compared with previous observations of twinning in thermallyformed martensite of Ti–48.9 at.% Ni and Ti–48.5 at.% Ni thin films. The mainsubstructure of thermally formed martensite in the thin films containing GP zones orTi2Ni precipitates consists of three orientations of fine (001) twins. On the other hand, thestress-induced martensite consists of domains of lamellar type II twins and fine (001) twins. While the domains of type II twins are preferably oriented in a way characteristic of stress-induced martensite,the (001) compound twins are not. The type II twins are introduced under stress as a lattice invariant shear, in preference to(001) compound twins.
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