Abstract
The effect of the spatial sampling rate on the quantitative phase information that can be retrieved from planar and tomographic edge illumination (EI) x-ray phase contrast imaging (XPCi) with a laboratory-based prototype scanner is analysed. The study is conducted on simulated and experimental data from a custom-built phantom. Optimal sampling rates, i.e. the minimum ones allowing the unambiguous extraction of quantitative phase measurements from the acquired data, are identified for planar and tomographic imaging. One of the key outcomes of this study is the demonstration that the optimal sampling rate in tomographic EI XPCi is low, allowing the implementation of low-dose volumetric imaging without having to compromise on quantitative accuracy.
Highlights
X-ray phase contrast imaging (XPCi) has been the focus of intensive research over the past two decades [1,2,3,4,5]
In a recent publication [24], we demonstrated that, when operated in computed tomography (CT) mode, edge illumination (EI) XPCi can provide reconstructions of the refractive index decrement δ which are accurate within the polychromaticity constraints imposed by the broad energy spectrum of a conventional x-ray source [25]
The experimentally acquired/simulated planar EI XPCi data and the results of the analysis are shown in figure 3
Summary
X-ray phase contrast imaging (XPCi) has been the focus of intensive research over the past two decades [1,2,3,4,5]. The contrast in XPCi arises due to phase (refraction) effects, which, for photon energies used in biomedical imaging, can be much larger than the attenuation. Effects exploited by conventional radiography [13]. Both effects can be described by the complex refractive index:
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