The effect of the electron temperature and current density profiles on the plasma current decay in JT-60U disruptions

Abstract

The plasma current decay during the initial phase of the current quench in JT-60U disruption has been calculated by a disruption simulation code (DINA) using the measured electron temperature Te profile. In the case of fast plasma current decay, Te has a peaked profile immediately after a thermal quench and the Te profile does not change significantly during the initial phase of the current quench. On the other hand, in the case of a slow plasma current decay, the Te profile is broader immediately after the thermal quench, and the Te profile shrinks. The results of the DINA simulation show that the plasma internal inductance Li increases during the initial phase of the current quench, whereas the plasma external inductance Le does not change over time. If the plasma is represented by a simple electrical circuit, the time derivative of Li functions as a resistance on the plasma current decay. It was confirmed that the increase in Li is caused by current diffusion toward the core plasma due to the decrease in Te in the intermediate and edge regions.