Abstract
The influence of stress-induced martensite ageing (SIM-ageing) on the two-way shape memory effect (TWSME) in Ni53Mn25Ga22 (at.%) single crystals was studied. The most effective regime of SIM-ageing (423 K, 175 MPa, 2–3 h) inducing the compressive TWSME with the strain of 3.6 (±0.2)% was established. The stability of the TWSME was investigated at thermal cycling through the temperature interval of martensitic transformations with and without overheating above the SIM-ageing temperature of 423 K. The TWSME strain does not decrease considerably during stress-free thermal cycling. In contrast, overheating above the SIM-ageing temperature on 30 K results in decreasing the TWSME strain down to 1.2%.
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