Abstract
A series of 0.6BiFeO<sub>3</sub>-0.4PbTiO<sub>3</sub> (BFO-PT) thin films were fabricated by sol-gel technique with sol concentrations varying from 0.2M to 0.4M. X-ray diffraction (XRD) and scanning electron microscope (SEM) were utilized to characterize the structure and morphology of the BFO-PT films. The crystallinity of the films is improved with increasing the BFO-PT sol concentration. The dielectric properties and leakage current density of BFO-PT films were measured. The dielectric constants of all films are reasonably stable and the dielectric losses are below 5%. Considerably lower leakage current density is obtained in our sol-gel films.
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