Abstract
The effect of SiO2 addition on the characteristics of CuFe2O4 ceramics for NTC thermistors has been studied. The ceramics were produced by pressing a homogeneous mixture of CuO, Fe3O4 and SiO2 (0–0.75 w/o) powders in appropriate proportions to produce CuFe2O4 based ceramics and sintering the pressed powder at 1100 °C for 2 hours in air. Electrical characterization was done by measuring electrical resistivity of the ceramics at various temperatures (25 °C–100 °C). Microstructure and structural analyses were also carried out by using optical microscopy and X‐ray diffraction (XRD), respectively. The XRD analyses showed that the CuFe2O4 and SiO2 added‐CuFe2O4 ceramics have crystal structure of cubic spinel. The presence of second phase could not be identified from the XRD analyses. According to the electrical data, it was known that the SiO2 addition increased the thermistor constant (B) and the room temperature electrical resistivity (ρRT). The value of B and ρRT of the produced CuFe2O4 ceramics namely B = 2...
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