The effect of silicon humic preparation on the biometrics of spring wheat germinated under stress

Abstract

Fluctuation of climatic conditions negatively affects the yield of farmers. To compensate for stress factors, various preparations are used, humic and silicon-containing preparations have been widely introduced. The silicon-humic preparation BoHum-K, obtained on the basis of a humic preparation and amorphous silicon oxide, is being tested at VNIIMZ. The studies were carried out with BoHum-K containing various amounts of SiO2. A laboratory experiment was carried out on wheat grown under simulated abiotic stresses. The preparation was used for pre-sowing seed treatment and spraying of seedlings. The obtained data on the biometrics of seedlings indicated that the use of a silicon humic preparation reduced the negative impact of simulated stresses. When treating seeds before sowing, the greatest increase in biometric indicators was noted with the use of BoHum-K with a silicon oxide content of 0.5% when simulating a decrease in temperature after sowing: the average length of the seedling increased by 10.1%, the raw weight by 14.3%, dry weight - by 10.9% compared with the control variant. When applying the spraying technique, depending on the simulated stress, the leaders were BoHum-K [0.1%] and BoHum-K [0.5%], the biomass increments were up to 20.0%. In general, according to the experiment, the increase in the biomass of seedlings from spraying wheat with BoHum-K [0.5%] averaged 12.7%, from seed soaking - 8.9%, which indicates the advantage of non-root treatment.