The effect of SEM preparation on pit membrane remnants in vessel element end-walls of primitive angiosperms

Abstract

Scanning electron microscope (SEM) is necessary to demonstrate presence or absence of pit membranes in possible perforations or the type of pit membrane remnants in perforations in vessel element end-walls of angiosperms, but it was unconfirmed and questionable whether pit membrane absence in pits was affected by the processing and handling before SEM observations. To solve this question, the secondary xylem of four woody species from primitive angiosperms, Illicium henryi Diels. (Illiciaceae), Schisandra rubriflora (Franch.) Rehd. et Wils. (Schisandraceae), Tetracentron sinensis Oliv. and Trochodendron aralioides Sieb. & Zucc. (Trochodendraceae) was chosen and the following techniques were used: (1) fresh materials were examined in low-vacuum with ESEM. (2) Air-dried materials were examined both in low- and high-vacuum with ESEM. (3) Fresh materials fixed in several different fixatives were observed in low-vacuum, respectively. (4) Smooth surface of the material by paraffin section methods was examined in high-vacuum. (5) Materials treated by Jeffrey's Fluid were observed in high-vacuum. Pit membranes and remnants in perforations of fresh material were little different from that of treated materials. Absence of the pit membrane in perforations (pits) in the end-wall was not attributed to the processing and handling. Information of pit membranes and remnants in perforations in end-wall based on the SEM observation might be validly claimed.