Abstract
The effect of the rubbing strength on the formation of the zigzag defects in surface stabilised ferroelectric liquid crystal (SSFLC) devices is demonstrated. Atomic force microscopy images of rubbed polyimide (PI) films reveal that the surface topography is modified by mechanical rubbing and reflection anisotropy spectroscopy reveals the surface anisotropy of the rubbed polyimide films increases with rubbing strength. Strongly rubbed PI films are found to generate zigzag lines and the density of these defects in the SSFLC layers is found to increase with rubbing strength.
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