Abstract
Thin films of Fe1-xNixS2 (0<or=x<or=1) solid solutions have been prepared by sulphuration of Fe-Ni layers previously flash evaporated. Their structural properties have been investigated by X-ray diffraction (XRD) as a function of the sulphuration temperature and Ni/Fe atomic ratio. The dependence of the lattice parameter on the Ni/Fe atomic ratio shows that Ni increases the dimensions of the unit cell, which appears to be initially compressed.
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