Abstract

The effect of molecular orientation at metal contacts on interface properties was determined by examining the local work function of porphyrin on atomically smooth graphite. The orientation was varied by self-assembly from the vapor phase, and the local potential was quantified by Kelvin force microscopy (scanning surface potential microscopy). When the porphyrin ring is oriented parallel to the substrate, the surface work function is 50 mV less than that of the highly ordered pyrolytic graphite; in contrast, when the porphyrin molecular plane is oriented perpendicular to the substrate, the surface work function is unchanged. The orientation dependence of the surface work function is determined by the geometric relationships between the delocalized charge densities in the molecule and substrate and possible interface bonding. The differences in interface properties with molecular configuration have important design implications to molecular electronic and organic electronic devices.

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