Abstract
A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is based mainly on field failure and repair times, it cannot currently be used to accurately predict end-of-life. In order to be truly predictive, physics-informed degradation processes and failure mechanisms need to be included in the model. This paper describes accelerated life testing of metal foil tapes used in thin-film PV modules, and how tape joint degradation, a possible failure mode, can be incorporated into the model.
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