Abstract

Pure nickel and three nickel containing single-phase concentrated solid solution alloys (SP-CSAs) have been irradiated using 3 MeV Ni2+ ions at 500°C to fluences of 1.5×1016 and 5.0×1016cm−2. The radiation-induced voids were characterized using cross sectional transmission electron microscopy that distributions of voids and dislocation loops were presented as a function of depth. A various degree of void suppression was observed on the tested samples and a defect clusters migration mechanism was proposed for NiCo. In order to sufficiently understand the defect dynamics in these SP-CSAs, the injected interstitial effect has been taken into account along with the 1-dimentional (1-D) and 3-dimentional (3-D) interstitial movement mechanisms.

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