Abstract
ABSTRACTThe effects of heat treatment at temperatures appropriate for solar cell device fabrication on grain boundaries in cast poicrystalline silicon have been studied. An MIS device structure using a 200° C heating was used for fabricating test devices on heat treated samples for EBIC studies. Grain boundary effective surface recombination velocities (Seffgb ) and effective mid-grain diffusion lengths were measured. Seffgb was found to increase after heat treatment. Segregation of oxygen to grain boundaries has been observed in heat treated samples.
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