The effect of gamma-irradiation on the activation energy of bulk and track etching in CR-39 plastic track detector

Abstract

Systematic studies have been made concerning the effects of gamma dose on the track registration properties of CR-39 plastics solid-state track detector (SSTD). The changes in bulk and track etch rates as well as in sensitivity due to gamma rays in the dose range of 0 – 10 3 kGy at different temperatures (338–353 K) are discussed on the basis of degradation and cross-linking mechanisms. The increase in bulk and track etch rates with gamma dose has been found while a rapid fall off in sensitivity at higher dose is also seen. From these measured values of bulk and track etch rates, the activation energies associated with them have also been calculated which show a decrease from unirradiated to 10 3 kGy gamma dose.