Abstract
The effects of film resistance on the electron field emission properties of carbon films were systematically investigated by combining electron emission and DC current-voltage ( I– V) measurements. The field emission follows the Fowler–Nordheim law at lower fields. However, at high fields the emission current becomes limited by the resistance of the carbon film and deviates from the Fowler–Nordheim law. Using the emission I– V curves in this range, the carbon film resistance was estimated, and this agrees well with the resistance derived from the DC I– V curve. It is also shown how the film resistance can be used to effectively control the emission current across a wide range of applied voltage. This concept can be extended to confining the emission current for each emission site, hence achieving more uniform emission current over a large emission area.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
