Abstract
In this work, the change in the dielectric constant and thickness of the interfacial region around a nanoparticle in a composite is studied as a function of change in the composition of the filler material. An Electrostatic Force Microscopy (EFM) based method previously proposed by the authors, is used to examine the dependence of the interfacial parameters on the filler material. For this, two types of filler materials: barium titanate (BaTiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> ) and alumina (Al <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> ) are used with epoxy resin as host material. A 3-D finite element method (FEM) based model is used for the simulations. It is seen that change in filler material modifies the interface thickness and dielectric constant.
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