Abstract
Micro-scanning is an important technique in high-resolution IR imaging field. It can increase the system resolution and improve the performance of imaging systems. For the design of super-resolution IR imaging system, it is necessary to choose the optimum micros-canning mode according to the particular fill factor of sensor. Hence, it is very important to study the effect of fill factor on the micro-scanning image quality. Under some assumptions, this paper introduces the sampling-averaging MTF of detector array at spatial Nyquist frequency as a figure of merit to quantitatively evaluate the improvement of different micro-scanning modes to image quality for different fill factors (1, 2/3, 1/2, 1/3) of infrared sensor. Finally, typical sampling imaging processes of focal plane array with the above fill factors are simulated. Experimental results qualitatively descript the effect of fill factor on the micro-scanning image, and show a good agreement with theoretical analysis.
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