Abstract
A high transparent Cu doped ZnS thin films were successfully deposited by the spray pyrolysis method at different deposition times. X-ray diffraction (XRD) patterns showed that all films were monocrystalline with the wurtzite crystal structure. A small variation in the optical band gap for all films was observed, indicating that the variation of deposition time doesn't affect strongly the bandgap. The average crystallite size of prepared thin films was calculated using Scherrer's formula and found to be in the range 29–33 nm. The crystallite size and microstrain of samples were investigated. Raman scattering spectra indicate the presence of different phonon modes and different peaks of Photoluminescence spectra for all samples which confirmed the presence of the elements Zn, S, and Cu with a comparison to the previous reported work. Using scanning electron microscope (SEM) images of elaborated thin films show a spherical with agglomeration. UV–visible measurements revealed height transmittance in the visible range for all growth time.
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