The effect of cell thickness on module reliability

Abstract

This paper addresses the issue of the reliability of modules using ultra-thin crystalline silicon cells. Do thin cells have a greater likelihood of cracking during production, transport, installation or use and if so does this result in long term degradation of the power? The present qualification test sequence, IEC 61215 does not adequately address this issue, The only mechanical test in IEC 61215 is a static mechanical load test consisting of three load cycles that are performed after the accelerated stress tests. So even if this mechanical load test does break cells, it is unlikely to result in significant power loss. BP Solar has developed a test sequence for evaluation of cracked cells in PV modules. The test sequence incorporates a dynamic mechanical load test performed before the 50 thermal cycles/10 humidity freeze cycles of IEC 61215. Usually there is no significant power loss after the dynamic load testing. However, the subsequent thermal cycling opens up the cracks that propagated during the dynamic load test resulting in significant power loss. Having a test sequence that identifies damaged cells allows us to develop processes and handling procedures to minimize or eliminate damage to the ultra-thin cells, resulting in reliable modules.