Abstract
In this study, the effect of annealing pressure and time on the homogeneity and the formation of kesternite (Cu2ZnSnSe4; CZTSe) structure was investigated. The deposition of CZTSe coating was carried out using an electroplating method. The morphology and crystal structure of the coating were investigated using SEM–EDS, XRD and Raman spectroscopy. CZTSe films with optimized crystallinity and uniformity were obtained using an annealing process performed at 10 Torr for 1[Formula: see text]h. The use of lower pressures increases the crystallinity and the purity of CZTSe film and decreases the density of secondary phases and the annealing time provides an additional benefit.
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