Abstract
It has been determined that, in the normal range of aluminium coating thicknesses used to remove charge from non-conducting specimens in the electron microscope, no detectable influence on the elemental signals obtained in X-ray microanalysis is observed. This is in contrast to a previous report (Hopkins et al., J. Electron Microsc. Tech., 18:176-182, 1991) of a reduction in elemental signal with increasing aluminium coating thickness. An explanation of errors in the previous interpretation is provided.
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