Abstract
AbstractThree X‐ray spectrometric procedures have been developed to directly measure the Ga content in binary PuGa alloys. In one procedure en energy‐dispersive spectrometer is used; in the other two a wavelengh‐dispersive spectrometer is used. Certified reference alloys with known Ga content have been produced, and simple procedures to handle them safely have been developed. We have constructed an energy‐dispersive spectrometer system for analyzing Pu‐containing materials and charactrerized the low energy gamma‐ray spectrum of Pu.
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