Abstract
A pulsed microwave technique for the fast and accurate diagnostics of a complete set of thermal kinetic coefficients in single-layer film structures is developed. The technique is tested on La0.7(Pb0.7Sr0.3)0.3MnO3 films on LaAlO3 and SrTiO3 substrates—the structures featuring a temperature resistance coefficient of 5–7%, which is the highest for manganite-containing materials at room temperature. The results of numerical simulation show that the performance of the uncooled bolometers can be improved by optimizing the thermal conductivity of the substrate and matching the thermal resistances of the film-substrate and substrate-thermostat interfaces.
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