The Development and Characterization of Crystallographic Texture in thin films for Magnetic Recording

Abstract

ABSTRACTThe development of crystallographic texture in thin film longitudinal recording media is discussed. Polycrystalline thin films may obtain their crystallographic texture by means of a nucleation process such as epitaxial nucleation on a polycrystalline underlayer or by means of a process involving a preferred growth direction. In this paper we will discuss various epitaxial nucleation textures that are obtained in media produced for magnetic recording. We will discuss the way that the underlayer controls the crystallographic texture of the magnetic layer, as well as methods used to control the texture of the underlayer itself. We give a brief overview of some of our recent findings in the growth of NiAl and FeAl films used for underlayers. Finally we will briefly discuss what we have called the tilted electron beam technique. In this technique selected area electron diffraction patterns are obtained at different angles of tilt and the development of arcs in the patterns is analyzed so as to determine the type and amount of crystallographic texture which is present in the films.