Abstract
An X-ray fluorescence-confined spot technique has been developed and used for the determination of sulfur in compounds from air samples collected on small membrane filters and for lead and silicon in compounds from air samples collected on paper tape. On 100-mm2 spots, the minimum detectable limit for sulfur is 0.15μg, for lead and silicon it is 0.4μg. The technique is simple, precise, and rapid and should be applicable to the determination of elements above atomic number 12.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
