Abstract
It is often necessary to conduct individual component tests for the prediction and verification of system reliability. Moreover, system testing can be economically infeasible or even impossible. The question then arises as to how component test plans should be designed so as to minimize test costs. Acceptance procedures based on the sum of failures during component tests have been previously suggested in the literature only for a series system, parallel system, and a serial connection of redundant subsystems. This line of research is extended by considering serial connection of standby redundant and k-out-of- n subsystems. It is shown that the serial connection of the mixture of all these systems can also be modelled. The optimal component testing problem is formulated as a semi-infinite linear program, and a procedure to compute optimum component test times is developed. The solution procedure is based on the well known cutting plane idea and column generation technique. Numerical examples are also provided.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
