Abstract
AbstractSeveral special-purpose attachments have been designed and built for the Siemens horizontal diffractometer. Design details and experimental results are shown for the following equipment: (1) Low-temperature mount for poly crystalline materials—examples are shown illustrating identification of organic liquids crystallized at low temperatures, and results are presented on coefficient of thermal expansion of alloys in the binary system copper—platinum from −185 to 25°C. (2) Low-temperature mount for single-crystal studies—this design allows recording of higher-level layer lines by use of a domed beryllium window. Illustrations are shown for organic single crystals and for organic liquids crystallized in the lowtemperature mount. (3) Focusing attachment—this attachment uses a curved specimen mounted on the focusing circle (Seeman-Bohlin mounting). Comparisons of dispersion are made and examples such as the (400) reflection from molybdenum are shown using both curved and flat specimens. (4) Full-circle goniometer—this device has been used primarily for determining distribution of intensity in amorphous and semicrystalline polymers, but is applicable to study of single crystals. Examples of both of these applications are discussed.
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