Abstract
Amorphous As2S3, As2Se3 and As1Se99 bulk glasses and thin films were prepared by the melt quenching technique and vacuum thermal evaporation, respectively, on different substrates. The density (ρ) – determined by the simple and cheap method of precise weighting, refractive index (n), structural arrangement – inferred from Raman spectroscopy, and nanohardness (Hind) were determined for all the studied materials in both bulk and thin film states. It is found that regardless of the chemical composition, the bulk glass density, refractive index and nanohardness are higher in comparison with those of the corresponding virgin and by annealing relaxed thin films, and the observed differences are discussed. The almost negligible influence of the substrate on the thin films density, structural arrangement and nanohardness, was observed.
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