Abstract
Abstract Within the framework of thermally activated flux creep, we propose a method that directly combines the magnetic relaxation curves or the transport current-voltage ( I-V ) characteristics in the whole temperature range, and yields the current dependence of the effective pinning potential U eff (j). This method allows us to extend the time range of the magnetic relaxation or the voltage range of the I-V characteristics. A successful application of this method to the high- T c superconductors demonstrates that the fundamental mechanism of dissipation in these materials is thermally activated flux creep.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
