The coupling effect of simultaneous multi-wavelength irradiation on multilayer thin-films

Abstract

The damage probability and damage morphology of the multilayer dielectric films under two wavelengths simultaneous irradiation are investigated. The damage morphology result shows that both pit number and depth caused by simultaneous 1 ω and 3 ω irradiation increase sharply compared with 3 ω irradiation alone. The damage probability results demonstrate that the damage probability magnification ratio of the coupled wavelengths is bigger than 1, especially when 1 ω and 3 ω all held at near LIDT, the magnification ratio of the damage probability is 7–8, and these results are similar to a recent muti-wavelength damage study about KDP crystal.