Abstract
The depositions of urban aerosol collected by a low pressure impactor on aluminum foils were analyzed by SIMS (secondary ion mass spectroscopy). Cross-sectional secondary ion profiles across the aerosol-laden Al substrates show secondary deposits on the outside of the center of the spots. The deposition region of the spots is surrounded by a thin layer of aerosol particles. Distinct haloes and/or stagnation strips are formed on the impactor stages. In addition to the SIMS study, urban aerosol was collected on acetate foils and dark field illuminated photographs of the aerosol deposits are given. SIMS is a surface sensitive technique. The material in the secondary deposition areas comprises only a few percent of the mass deposited in the central spot, but includes almost completely the aerosol deposited surface accessible to wide beam SIMS analysis (described before [1, 2]).
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