Abstract
In order to obtain more accurate information of Compton profiles a new technique, the Compton fluorescence scattering (CFS), was further developed. The most important advantage of the CFS compared with the conventional x-ray technique is that the background is small and well defined. With respect to γ radiation the resolution is much better and influences of multiple scattering are less serious. As an example the results on aluminum with Ag Kα radiation and a LiF 600 analyzer demonstrate that deviations between previous results with the Mo Kα conventional method and 412- and 59-keV γ measurements respectively could be interpreted. The best agreement was found with the 412-keV γ results.
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