Abstract
The controllability of pore density and diameter is critical for emerging applications, e.g., non-lithographic photonic-crystal formation; however pore density and diameter could either increase or decrease self-orderedly with enhanced current density. In this letter, similar paradoxical phenomena were demonstrated; the etch rate as a function of field strength was evidenced and interpreted in light of current-burst-model. Based on a hybrid of SCR (space charge region) and breakdown effects, a semi-quantitative model was established in order to disentangle the paradox: such a model could also potentially serve as a design reference for various applications as far as breakdown comes into play. The paradox was finally found to be dominated by physics on patterned samples.
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